MERLIC 5.2 facilitates the newly developed Deep Learning method "Global Context Anomaly Detection". This state-of-the-art technology detects new variants of anomalies by "understanding" the logical content of images. This feature is especially useful in any industry, which needs completeness checks, quality inspections, defect detection, or print inspections during its production process. All that is required are good-quality images, therefore no time-consuming labelling is needed.
For the training of Deep Learning applications, it is possible to use the free Deep Learning Tool (DLT) from MVTec. The results can then be imported from the DLT into MERLIC and executed there without any programming effort.