JAI - Wave WAA
High-performance InGaAs SWIR area scan cameras is a perfect fit for a wide range of machine vision applications like Wafer inspection, Recycling, Seal inspection and many more.
Key Features
- 1.3-megapixel resolution
- Spectral response from 400–1700 nm
- Up to 90 frames per second
- 5 μm square pixels
- GigE Vision interface
- C-mount lens mount
- ThermoElectric Cooling (TEC)
Find the right model for your needs
Use the filters below to narrow down your selection based on your application requirements
| Product Name | Dimension (depth, mm) | Dimension (height, mm) | Dimension (width, mm) | Frame rate (Hz) | Resolution Horizontal (Px) | Housing | Interface | Lens mount | Manufacturer | Pixel size (µm) | Resolution (MP) | Scan type | Sensor format | Sensor model | Sensor size diagonal (mm) | Sensor type | Shutter type | Wavelength range | Weight (kg) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 80.5 | 50 | 50 | 90 | 1280 | standard | Gigabit Ethernet | C-Mount | JAI | 5 | 1.3 | area | 1/2" | IMX990 | 8.2 | InGaAs | Global shutter | SWIR | 0.400 |
Why choose JAI - Wave WAA?
See Beyond the Limits of Visible Imaging
Extended imaging from 400 to 1700 nm with a single InGaAs sensor Customers can detect defects, material differences, and hidden features that conventional visible-light cameras may miss. This leads to more reliable inspection results, improved quality control, and better decision-making in demanding machine vision applications.
Simplify System Integration with One Camera
Captures visible and SWIR information in a single sensor Customers can reduce system complexity by avoiding multiple cameras, image registration, and additional processing steps. The result is easier integration, lower engineering effort, and reduced total system cost.
Ensure Stable Performance in Changing Environments
Integrated ThermoElectric Cooling (TEC) and fan for temperature-stable imaging By reducing dark noise and stabilizing sensor temperature, the camera delivers consistent image quality, improved dynamic range, and reliable calibration stability. Customers benefit from dependable performance and more accurate inspection outcomes, even in temperature-sensitive SWIR applications.
One Platform for a Wide Range of Industrial Applications
Broad spectral sensitivity enables use across inspection, measurement, and sorting applications From food sorting and semiconductor alignment to recycling, laser beam profiling, and seal inspection, customers can use one camera platform for multiple high-value tasks. This provides greater flexibility, application versatility, and stronger return on investment.