JAI - Wave WAA
High-performance InGaAs SWIR area scan cameras is a perfect fit for a wide range of machine vision applications like Wafer inspection, Recycling, Seal inspection and many more.
Key Features
- Sensor: InGaAs (IMX990)
- Spectral range: 400-1700 nm (Visible + SWIR)
- Resolution: 1.3 MP (1280 × 1024)
- Optical format: 1/2"
- Pixel size: 5.0 × 5.0 µm
- Frame rate: Up to 90 fps
- Shutter type: Global shutter
- ROI: Yes
- Video output: Mono 8/10/12-bit
- Gain: 0–42 dB
- Cooling: Integrated single-stage TEC
- Interface: Gigabit Ethernet (1000BASE-T) (GigE Vision)
- Lens mount: C-Mount
- ISP functions: FFC, DPC, black level, gamma control, LUT, denoise
- Power consumption: 6.5 W
- Operating temperature: -20°C to +55°C
- Dimensions (H × W × L): 60.0 × 60.0 × 80.5 mm
- Weight: 400 g
Find the right model for your needs
Use the filters below to narrow down your selection based on your application requirements
| Produktname | Wavelength range | Resolution (MP) | Frame rate (Hz) | Lens mount | Interface | Sensor model | Manufacturer | Dimension (depth, mm) | Dimension (height, mm) | Dimension (width, mm) | Resolution Horizontal (Px) | Housing | Pixel size (µm) | Scan type | Sensor format | Sensor size diagonal (mm) | Sensor type | Shutter type | Weight (kg) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| SWIR | 1.3 | 90 | C-Mount | Gigabit Ethernet | IMX990 | JAI | 80.5 | 50 | 50 | 1280 | standard | 5 | area | 1/2" | 8.2 | InGaAs | Global shutter | 0.400 |
Warum JAI - Wave WAA?
Reveals Material Properties Beyond the Visible
SWIR sensitivity exposes moisture content, ripeness, subsurface defects, and seal integrity that surface appearance alone cannot show, supporting inspection decisions visible-only imaging would miss entirely.
Blur-Free Capture of Moving or Presented Objects
Global shutter exposes the full frame at once, so objects still settling into position or moving on a pick-and-place cell are captured without motion blur.
Configurable to the Application
Region-of-interest selection and binning let integrators match acquisition to object size and required cycle time without changing hardware.
Cleaner Output, Less Processing Overhead
On-camera flat-field correction, defective pixel correction, and black level and gamma control deliver corrected image data to the host, reducing downstream processing.
Built for Industrial Environments
Rated to -20°C/+55°C, covering food, pharmaceutical, packaging, and semiconductor inspection environments.
Fits Existing Infrastructure
GigE Vision and a standard C-mount in a compact 60 × 60 mm housing mean the camera drops into existing area scan positions and software stacks without a redesigned system.
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