Xenics - Lynx
Compact uncooled shortwave infrared (SWIR) line scan camera
Key Features
- Spectral band 0.9–1.7 µm
- Resolution: up to 2048 pixels
- Line rate: 10 kHz or 40 kHz
- Pixel size: 12.5 µm or 25 µm
- Features: integration from 1µs to several minutes, integrate while read / integrate then read, snapshot acquisition
- I/O: trigger in and out, LVCMOS, free running or user selectable frame size
- Interface: GigE Vision, CameraLink
- Camera configuration: fully GenICam compliant; using Xenics Xeneth software or any SDK
- Operating temperature: -40°C to 55°C or -40°C to 70°C
Find the right model for your needs
Use the filters below to narrow down your selection based on your application requirements
| Nom de produit | Wavelength range | Resolution Horizontal (Px) | Max. line freq. (kHz) | Lens mount | Interface | Scan type | Pixel size (µm) | Manufacturer | Dimension (depth, mm) | Dimension (height, mm) | Dimension (width, mm) | Sensor type | Weight (kg) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| Monochrome; SWIR | 512 | 40 | C-Mount | Gigabit Ethernet | line | 25 | Xenics | 49 | 49 | 62 | InGaAs | N/A | |
| Monochrome; SWIR | 1024 | 40 | C-Mount | Gigabit Ethernet | line | 12.5 | Xenics | 49 | 49 | 62 | InGaAs | N/A | |
| Monochrome; SWIR | 2048 | 10 | C-Mount | Gigabit Ethernet | line | 12.5 | Xenics | 49 | 49 | 62 | InGaAs | N/A | |
| Monochrome; SWIR | 512 | 40 | C-Mount | CameraLink | line | 25 | Xenics | 49 | 49 | 62 | InGaAs | N/A | |
| Monochrome; SWIR | 1024 | 40 | C-Mount | CameraLink | line | 12.5 | Xenics | 49 | 49 | 62 | InGaAs | N/A | |
| Monochrome; SWIR | 2048 | 10 | C-Mount | CameraLink | line | 12.5 | Xenics | 49 | 49 | 62 | InGaAs | N/A |
Pourquoi choisir Xenics - Lynx ?
SWIR imaging with high speed
With a line rate of up to 40 kHz and 14-bit A/D conversion, the Xenics Lynx is ideal for high-speed scanning tasks such as online quality inspection.
High-resolution sensor
The Lynx offers line widths of up to 2k pixels. This exceptionally high resolution helps to detect very small production defects and solve difficult SWIR applications.
Reliable inspection of silicon based material
As silicon-based materials only become transparent at a wavelength of 1350 nm, SWIR imaging is used for photoluminescence inspection in the solar industry. Material defects, inclusions or fractures are visible. These non-contact and non-destructive testing techniques enable rejects of substandard objects at an early production stage, resulting in increased production efficiency, reduced production costs and improved quality.
Proven industrial interfaces
The series offers standard interfaces such as CameraLink and Ethernet (GigE Vision) for easy and flexible connection to the PC. Thanks to these standardised machine vision interfaces, a wide range of vision software can be used for data processing.
Xeneth: Graphical user interface to setup, control, record and measure temperature
Xeneth is a graphical user interface that allows for easy set-up and control of infrared cameras and acquisition of images. All IR camera control settings such as integration time, AD settings, detector temperature and gain can be optimised by the user.
Once configured, almost all settings can be uploaded to the cameras for smooth standalone operation with, for example, third-party machine vision applications.
The standard software is supplied free of charge with every Xenics camera for easy set-up and control of the camera.