LMI - Gocator 6300

Gocator 6300 Series line profilers deliver a supremely effective combination of fast scan rates to meet inline production cycle times, with high X Profile Data Intervals for precision measurement at large fields of view.

Key Features

  • Over 6500 points per profile for precision 3D measurement and inspection
  • X Profile Data Interval down to < 2.1 microns (at 13.4 millimeters FOV)
  • Z-repeatability down to 0.15 microns
  • Scan rate > 1.8 kHz full-frame (FOV/MR)
  • Field of View up to 31 mm (at < 4.3 microns X Profile Data Interval)
  • On-sensor measurement tools and I/O connectivity
  • Onboard multi-sensor alignment and networking support

Find the right model for your needs

Use the filters below to narrow down your selection based on your application requirements

Bis
Bis
Produktname Dimension (depth, mm) Dimension (height, mm) Dimension (width, mm) Resolution Horizontal (Px) Interface LED risk group Lens mount Manufacturer Pixel size (µm) Scan type Sensor format Sensor size diagonal (mm) Weight (kg)
57.5 151.71 145.25 N/A Gigabit Ethernet N/A None LMI Technologies N/A laser triangulation N/A N/A 1.700
57.5 140.25 155.25 N/A Gigabit Ethernet N/A None LMI Technologies N/A laser triangulation N/A N/A 1.700
57.5 140.25 155.25 N/A Gigabit Ethernet N/A None LMI Technologies N/A laser triangulation N/A N/A 1.700
57.5 140.25 155.25 N/A Gigabit Ethernet N/A None LMI Technologies N/A laser triangulation N/A N/A 1.700
57.5 151.71 145.25 N/A Gigabit Ethernet N/A None LMI Technologies N/A laser triangulation N/A N/A 1.700
57.5 151.71 145.25 N/A Gigabit Ethernet N/A None LMI Technologies N/A laser triangulation N/A N/A 1.700

Warum LMI - Gocator 6300?

Enhanced Quality and Versatile Scanning

Optimized surface flatness & Noise Reduction for Precise Feature Identification across diverse applications achieve superior results for 3D quality inspection.

Micron level measurements

Measure micron level features with the 2600’s 9 megapixel camera and large field of view for in-line dimensional measurement and microscopic surface defect detection on on small parts such as semiconductor or EV Battery inspection.

Inspect with speed and precision

Faster scan and acquisition speeds empower you to speed up your inline process and use higher resolutions. It also means multiple exposures can be used to accurately measure high-contrast targets. With an X resolution down to 2.5 µm, you can generate data points even on very tiny edges or narrow gaps.

Easy to integrate

A small footprint and lightweight body make this sensor ideal for fitting into tight spaces and mounting on robotic arms.

High dynamic range

The High Dynamic Range (HDR) Mode improves scan quality on challenging targets that previously were susceptible to over or underexposed features. Targets that previously required multiple exposures to scan challenging features may now be captured with a single exposure and faster cycle time.

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