JAI Wave WAA Series

Area scan cameras capture a full frame in a single exposure, the appropriate architecture for objects presented to the camera rather than moving continuously past it: parts on a tray, packaging on a stop-and-inspect station, or samples under a microscope stage. 

Standard InGaAs sensors respond to SWIR but block most visible light. An extended sensor design lets visible-range photons reach the InGaAs layer alongside SWIR photons, so a single camera captures both bands without a beam splitter or a second optical path. 

This matters where an inspection decision depends on the object’s surface appearance and its subsurface or moisture properties together, rather than one or the other. 

A single sensor delivers that combined view, with thermoelectric cooling holding sensor noise steady so results stay consistent without a two-camera setup. 

Reveals Material Properties Beyond the Visible 
SWIR sensitivity exposes moisture content, ripeness, subsurface defects, and seal integrity that surface appearance alone cannot show, supporting inspection decisions visible-only imaging would miss entirely. 

Blur-Free Capture of Moving or Presented Objects 
Global shutter exposes the full frame at once, so objects still settling into position or moving on a pick-and-place cell are captured without motion blur. 

Configurable to the Application 
Region-of-interest selection and binning let integrators match acquisition to object size and required cycle time without changing hardware.  

Cleaner Output, Less Processing Overhead 
On-camera flat-field correction, defective pixel correction, and black level and gamma control deliver corrected image data to the host, reducing downstream processing. 

Built for Industrial Environments 
Rated to -20°C/+55°C, covering food, pharmaceutical, packaging, and semiconductor inspection environments. 

Fits Existing Infrastructure 
GigE Vision and a standard C-mount in a compact 60 × 60 mm housing mean the camera drops into existing area scan positions and software stacks without a redesigned system. 

Visible and SWIR data captured together support grading on surface quality and size alongside moisture content, ripeness, and early spoilage that surface appearance alone does not reveal. 

SWIR sensitivity reveals alignment marks beneath silicon layers without altering the wafer, supporting precise layer-to-layer alignment during processing. 

Enhanced contrast in transparent and semi-transparent materials makes heat seals measurable where visible-light imaging alone loses the boundary, supporting seal quality verification. 

SWIR sensitivity supports verification of material classification after sorting and evaluation of new sorting criteria, including for larger or irregularly shaped objects where motion control is limited. 

Firmware configuration, camera pre-settings, and commissioning documentation, reducing on-site setup time for Wave Series installations. 

Feasibility testing validates visible and SWIR contrast using actual production material samples before system specification. Technical coaching covers illumination selection and acquisition parameter optimisation for combined visible and SWIR capture. 

For application-specific subsystem development or Visible + SWIR imaging within existing production line control infrastructure: project qualification and development through to series readiness. 

The WAA-1300-GE-TEC is an area scan camera, capturing a full frame in a single exposure, suited to discrete object inspection such as stop-and-go stations and pick-and-place lines. The WAL-1001-GE and WAL-2001-GE are line scan cameras that build an image line by line as material moves continuously through the field of view, suited to conveyor, web, and reel-to-reel inspection. Selection depends on whether the inspection target is discrete or continuously moving. 

A single exposure delivers both surface-level visible detail and SWIR-range material information, such as moisture content or subsurface defects, without the alignment and synchronisation required by a two-camera visible and SWIR setup. 

It is appropriate when the inspection decision depends on both visible-range appearance and SWIR-range material properties, and when the object is presented to the camera rather than moving continuously past it. Where only SWIR data is needed on a continuous line, a Wave WAL line scan camera is generally the better fit. 

TEC cooling maintains a stable sensor operating temperature, reducing dark noise and helping keep calibration data reliable across long production runs, particularly relevant in environments with variable ambient temperature.  

Illumination needs to provide sufficient output across both the visible and SWIR ranges, or dual-band illumination matched to the inspection requirement. STEMMER IMAGING supports illumination selection through its Engineering Services. 

The camera uses GigE Vision (1000BASE-T) and is compatible with any GigE Vision-compliant acquisition framework, including STEMMER IMAGING’s CVB Common Vision Blox and JAI SDK.   

Yes. STEMMER IMAGING provides feasibility testing through its Engineering Services, validating visible and SWIR contrast against actual production material samples before system specification.