Teledyne DALSA - Genie Nano-10GigE

The Teledyne DALSA Genie Nano features 2 inputs and 3 opto-coupled outputs, both programmable, with versatile configuration options to suit your needs. Implementation and integration effort can be reduced, typically reducing cost. Fewer components can also result in cost savings for repairs and maintenance.

With the trigger-to-image reliability framework, the image capture process is controlled and monitored end-to-end from the trigger to the transfer to the host memory. This way data loss is clearly tracked and the reliability of the overall inspection process is improved. This helps increase the quality of your inspection by sorting out parts that have not been inspected due to shortfcomings in the image capture process.

The extended operating temperature range makes the Teledyne DALSA Genie Nano an ideal match for harsh environments. Even with extreme temperature differences there is no need for external cooling or protective housings. The high temperature range and high MTBF help extend camera life and increase system reliability, resulting in less to no production downtime and extending the endurance of a machine.

Different applications have different requirements for image acquisition and image processing. Some of these sometimes demanding requirements are high dynamic range, 10 bit pixel depth, use of the camera sensor’s highest internal read-out speed, or extending the capacity of the data throughput beyond the limits of GigE Vision by means of (lossless or lossy) image compression.

The cycling mode implements a method to use various different user-controlled configurations. This allows working with different light sources, lighting angles, exposure times, gains etc. for every line. That way, a single pass with a single camera delivers a high amount of information which is comparable to that of multiple cameras or combinations of camera and frame grabber. With this feature, costly and complex hardware solutions can be avoided, since e.g. multiple illumination variants of the same object increase failure detection and production security. It can also reduce inspection time in cases where various illumination set-ups are mandatory to inspect one object.