JAI - Wave WAL
High-performance InGaAs SWIR line scan cameras is a perfect fit for a wide range of machine vision applications like Wafer inspection, Recycling, Seal inspection and many more.
More product highlights about JAI Wave Series
Key Features
- 1K and 2K resolution line scan
- 12.8 mm wide sensor with 12.5 µm square pixels
- Up to 29 kHz (29,000 lines/s) scan rate
- GigE Vision interface for efficient data transfer
- InGaAs-based SWIR industrial camera (900–1700 nm spectral response)
- Selectable output formats (Mono8/10/12/14-bit)
- Supports FFC (Flat Field Correction), DPC (Defective Pixel Correction), Sharpness, Destripe, black level control and LUT
- Gain control includes digital gain and analog gain
- Standard C-mount
Find the right model for your needs
Use the filters below to narrow down your selection based on your application requirements
| Produktname | Dimension (depth, mm) | Dimension (height, mm) | Dimension (width, mm) | Resolution Horizontal (Px) | Interface | Lens mount | Manufacturer | Max. line freq. (kHz) | Pixel size (µm) | Scan type | Sensor type | Wavelength range | Weight (kg) |
|---|---|---|---|---|---|---|---|---|---|---|---|---|---|
| 117 | 90 | 90 | 1024 | CameraLink | M52 x 0.75 | JAI | 39.2 | 25 | line | InGaAs | SWIR | 0.910 | |
| 57.6 | 60 | 60 | 1024 | Gigabit Ethernet | C-Mount | JAI | 29 | 12.5 | line | InGaAs | SWIR | 0.320 | |
| 55.5 | 60 | 60 | 2048 | Gigabit Ethernet | C-Mount | JAI | 40 | 12.5 | line | InGaAs | SWIR | 0.309 |
Warum JAI - Wave WAL?
Reveal what standard cameras miss
Wave Series cameras detect moisture content, material variations, and defects that remain invisible to conventional visible-light systems. This helps customers improve inspection accuracy, reduce false rejects, and make faster, more reliable quality decisions.
Gain deeper insight with SWIR line scan imaging from 900 nm to 1700 nm
The Wave Series line scan SWIR cameras operate in a spectral range from 900 nm to 1700 nm, making material differences, moisture content, and defects visible beyond the capabilities of standard imaging systems. This helps customers improve detection reliability, optimize sorting and inspection processes, and achieve greater efficiency in industrial applications.
Achieve reliable results even in low-light and high-precision applications
The line scan SWIR cameras (WAL) combine large 12.5 μm pixels with 14-bit output and 16,384 grayscale levels for excellent sensitivity and precise defect detection. This enables customers to identify even subtle material differences, improve yield, and reduce costly production errors.
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